26 August 1977 Increased Depth Of Focus In Scanning Microscope
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Proceedings Volume 0104, Multidisciplinary Microscopy; (1977) https://doi.org/10.1117/12.955418
Event: 1977 SPIE/SPSE Technical Symposium East, 1977, Reston, United States
Abstract
A technique is described which yields an increased depth of focus in a scanning microscope system. The technique's utility for certain types of objects is demonstrated experimentally.
© (1977) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert L. Whitman, "Increased Depth Of Focus In Scanning Microscope", Proc. SPIE 0104, Multidisciplinary Microscopy, (26 August 1977); doi: 10.1117/12.955418; https://doi.org/10.1117/12.955418
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