26 August 1977 New Approaches To Phase Microscopy
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Proceedings Volume 0104, Multidisciplinary Microscopy; (1977) https://doi.org/10.1117/12.955410
Event: 1977 SPIE/SPSE Technical Symposium East, 1977, Reston, United States
There has been considerable interest in recent years in devising methods that can provide direct, accurate, and real time microscopic measurements of phase objects, even when the path difference variations are large. Various approaches have used direct coherent imaging, modification of phase contrast microscopy, scanning interferometry, and holographic methods. These various approaches are reviewed and examples discussed.
© (1977) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Brian J. Thompson, "New Approaches To Phase Microscopy", Proc. SPIE 0104, Multidisciplinary Microscopy, (26 August 1977); doi: 10.1117/12.955410; https://doi.org/10.1117/12.955410

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