29 August 1977 Microchannel Plate Response To Hard X-Rays
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Proceedings Volume 0106, X-Ray Imaging; (1977) https://doi.org/10.1117/12.955470
Event: 1977 SPIE/SPSE Technical Symposium East, 1977, Reston, United States
Abstract
We have measured both the current response and the pulse response of a microchannel plate, MCP, to X-rays incident at an angle of 45° in the energy range of 8 to 100 keV. The X-ray detection efficiency, pulse height distributions, and sensitive depth of the MCP were determined from these data. We find that detection efficiency extrapolates to zero below 8 keV, and ranges between values of 1% and 2.6% above this energy, much higher than anticipated from previous measurements for oblique incidence below 6 keV. When compared to previous measurements at higher energies, we conclude that MCP's have a relatively constant detection efficiency in the energy range 10 to 600 keV, which is a rather unique property as compared to other X-ray detectors. We find that the shape of current response curves differs somewhat from the shape of efficiency curves, that pulse height distributions are proportional to pulse height to the -1.1 to -1.6 power, and that 90% of the current ori-ginates in the first 25 to 30% of the MCP thickness.
© (1977) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. W. Dolan, K. W. Dolan, J. Chang, J. Chang, } "Microchannel Plate Response To Hard X-Rays", Proc. SPIE 0106, X-Ray Imaging, (29 August 1977); doi: 10.1117/12.955470; https://doi.org/10.1117/12.955470
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