X-Ray Quantum Efficiency Of Microchannel Plates

Paul J. Bjorkholm; Leon P. Van Speybroeck; Michael Hecht

doi:10.1117/12.955471

29 August 1977 X-Ray Quantum Efficiency Of Microchannel Plates

Paul J. Bjorkholm, Leon P. Van Speybroeck, Michael Hecht

Proceedings Volume 0106, X-Ray Imaging; (1977) https://doi.org/10.1117/12.955471
Event: 1977 SPIE/SPSE Technical Symposium East, 1977, Reston, United States

Abstract

The quantum efficiency of microchannel plates has been measured at energies from 0.28 to 3.0 keV and at angles less than 6°. The quantum efficiency reaches a maximum of 27% at 3° and an energy of 0.86 keV. At all energies, the quantum efficiency increases as the angle of incidence decreases until a critical angle is reached, after which the efficiency decreases rapidly. The quantum efficiency, outside of the small angle dip, decreases with energy at a constant angle. The general behaviour of the quantum efficiency can be understood using a very simple physical model. The low angle dip is caused by reflection from the surface of the channel. The variation of the quantum efficiency as a function of energy can be explained by the variation of the X-ray absorption and of the photo- and Auger electron ranges. The data are reasonably reproduced by a simple model.

Citation Download Citation

Paul J. Bjorkholm, Leon P. Van Speybroeck, and Michael Hecht "X-Ray Quantum Efficiency Of Microchannel Plates", Proc. SPIE 0106, X-Ray Imaging, (29 August 1977); https://doi.org/10.1117/12.955471

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