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26 September 1977 Scattering From Infrared Transparent Materials
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Proceedings Volume 0107, Stray Light Problems in Optical Systems; (1977) https://doi.org/10.1117/12.964595
Event: 1977 SPIE/SPSE Technical Symposium East, 1977, Reston, United States
Abstract
Forward and backward scattering data on 20 infrared radiation transparent materials is presented. The samples include IRTRANs 1, 2, and 4 and other selected infrared radiation materials including Aℓ203, As2S3, CaF2, CdTe, GaAs, Ge and PVT ZnSe. The measurements were made at wavelengths of 0.6328, 1.6, 3.39, and 10.6 μm . The angular distribution of the scattering was measured from 0. 5° to 70°.
© (1977) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. R. Scheele "Scattering From Infrared Transparent Materials", Proc. SPIE 0107, Stray Light Problems in Optical Systems, (26 September 1977); https://doi.org/10.1117/12.964595
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