19 October 1977 Ellipsometric Study Of Light-Induced Changes In Silver Iodide Thin Films
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Ellipsometric measurements are affected by the electron population in surface states. This creates difficulities when studying adsorption, but also presents the experimenter with another way of studying these states. We have explored the possibility of using ellipsometry to study the electronic surface structure of silver iodide by making the ellipsometric measurements at one unchanging wavelength while illuminating the film with light of varying wavelength and observing the resulting changes in the ellipsometric parameters. Previous ellipsometric studies of surface states have not made use of the second light source. Our results indicate that this method is practical and also indicate that care must be taken when using ellipsometry to study adsorption reactions when other light sources also illuminate the surface.
© (1977) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Gary Layton, R. Gary Layton, } "Ellipsometric Study Of Light-Induced Changes In Silver Iodide Thin Films", Proc. SPIE 0112, Optical Polarimetry: Instrumentation and Applications, (19 October 1977); doi: 10.1117/12.955547; https://doi.org/10.1117/12.955547


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