Ellipsometry Of Electrochemical Surface Layers

Rolf H. Muller

doi:10.1117/12.955544

19 October 1977 Ellipsometry Of Electrochemical Surface Layers

Rolf H. Muller

Proceedings Volume 0112, Optical Polarimetry: Instrumentation and Applications; (1977) https://doi.org/10.1117/12.955544
Event: 21st Annual Technical Symposium, 1977, San Diego, United States

Abstract

The measurement of changes in the state of polarization of light due to reflection provides an unusually sensitive tool for observing surface layers in any optically transparent environment. A fast, self-compensating ellipsometer has been used to observe the electro-chemical formation of reacted surface layers. The optical effect of mass-transport boundary layers and component imperfections have been taken into account in the interpretation of results.

Citation Download Citation

Rolf H. Muller "Ellipsometry Of Electrochemical Surface Layers", Proc. SPIE 0112, Optical Polarimetry: Instrumentation and Applications, (19 October 1977); https://doi.org/10.1117/12.955544

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