22 November 1977 An Automated Visual Edge Match System For Image Quality Assessment
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Proceedings Volume 0117, Data Extraction and Classification from Film; (1977); doi: 10.1117/12.955659
Event: 21st Annual Technical Symposium, 1977, San Diego, United States
This paper describes a system which automatically matches scene edges to a physical matrix of test edges for the purpose of estimating image quality. The system developed by EIKONIX is based upon the Itek Visual Edge Match (VEM) Station, highly modified to provide the automatic function. Random edge location and identification is performed by the operator. Scanning is accomplished by means of a one-dimensional self-scanned photodiode array coupled to the microscope by an anamorphic optical system. The data is processed internally by means of a unique eigenvector approach which yields an interesting and sensitive quality discriminator. Calibration is automatic, the machine being operated under computer control in one of several modes. Training time is minimal, and the design of the densitometric system is such that many of the common error sources and limits on dynamic range are avoided. The paper includes system design and analytical considerations as well as experimental data.
© (1977) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jack D. Finley, "An Automated Visual Edge Match System For Image Quality Assessment", Proc. SPIE 0117, Data Extraction and Classification from Film, (22 November 1977); doi: 10.1117/12.955659; https://doi.org/10.1117/12.955659

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