6 June 1978 0.5 TO 2.0 Micrometer Spot Scan System
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Proceedings Volume 0132, Utilization of Infrared Detectors; (1978) https://doi.org/10.1117/12.956057
Event: 1978 Los Angeles Technical Symposium, 1978, Los Angeles, United States
A system to evaluate photodetectors sensitive in the 0.5 to 2.0 micrometer spectral band has been designed, fabricated and calibrated. The system consists of a spot scanner which is controlled by a desk top calculator. Responsivity data is sampled and processed by the calculator. The system is used to evaluate photodetectors for uniformity of responsivity, quantum efficiency, optical area and crosstalk.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William D. Rogatto, William D. Rogatto, } "0.5 TO 2.0 Micrometer Spot Scan System", Proc. SPIE 0132, Utilization of Infrared Detectors, (6 June 1978); doi: 10.1117/12.956057; https://doi.org/10.1117/12.956057


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