18 April 1978 Comparison Of Wavelengths To The Primary Standard At The French National Institute Of Metrology
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Proceedings Volume 0136, 1st European Conf on Optics Applied to Metrology; (1978) https://doi.org/10.1117/12.956136
Event: First European Conference on Optics Applied to Metrology, 1977, Strasbourg, France
Abstract
We describe some properties of the two beam interferometer that we have built at the "Institut National de Metrologie" for wavelength comparison. We describe particularly the phase shifts between visible wave-lengths at zero path difference.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Bouchareine, P. Bouchareine, A. Janest, A. Janest, } "Comparison Of Wavelengths To The Primary Standard At The French National Institute Of Metrology", Proc. SPIE 0136, 1st European Conf on Optics Applied to Metrology, (18 April 1978); doi: 10.1117/12.956136; https://doi.org/10.1117/12.956136
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