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18 April 1978 Electronic Processing Of Moire Fringes. Application To Moire Topography And Elements Of Comparison With Photogrammetry
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Proceedings Volume 0136, 1st European Conf on Optics Applied to Metrology; (1978) https://doi.org/10.1117/12.956178
Event: First European Conference on Optics Applied to Metrology, 1977, Strasbourg, France
Abstract
Some elements of comparison are given between the projection-type Moire topography and photogrammetry. The basic mathematics of photogrammetry is applied to reconstruct the 3.D. Shape of the object from the Moire pattern. Some particular aspects of the Moire method are discussed and a general methodology is proposed. In connection with this, an opto-electro nic technique is described, which measures the Moire phase with high resolution and sign determination. The experimental results show that this technique is especially suitable for high accuracy automatic reconstruction of 3.D. Shapes.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. C. Perrin and A. Thomas "Electronic Processing Of Moire Fringes. Application To Moire Topography And Elements Of Comparison With Photogrammetry", Proc. SPIE 0136, 1st European Conf on Optics Applied to Metrology, (18 April 1978); https://doi.org/10.1117/12.956178
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