18 April 1978 The Diffracting Gauge In Extensometry
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Proceedings Volume 0136, 1st European Conf on Optics Applied to Metrology; (1978) https://doi.org/10.1117/12.956168
Event: First European Conference on Optics Applied to Metrology, 1977, Strasbourg, France
Abstract
The principe of the diffracting gauge is based on the farfield diffraction spectrum of a slit. In extensometry this gauge permits to measure easely and cheaply strain components with great sensibility and fidelity in time.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean P. L. Ebbeni, "The Diffracting Gauge In Extensometry", Proc. SPIE 0136, 1st European Conf on Optics Applied to Metrology, (18 April 1978); doi: 10.1117/12.956168; https://doi.org/10.1117/12.956168
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