The Diffracting Gauge In Extensometry

Jean P. L. Ebbeni

doi:10.1117/12.956168

18 April 1978 The Diffracting Gauge In Extensometry

Jean P. L. Ebbeni;

Author Affiliations +

Proceedings Volume 0136, 1st European Conf on Optics Applied to Metrology; (1978) https://doi.org/10.1117/12.956168
Event: First European Conference on Optics Applied to Metrology, 1977, Strasbourg, France

Abstract

The principe of the diffracting gauge is based on the farfield diffraction spectrum of a slit. In extensometry this gauge permits to measure easely and cheaply strain components with great sensibility and fidelity in time.

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Jean P. L. Ebbeni, "The Diffracting Gauge In Extensometry", Proc. SPIE 0136, 1st European Conf on Optics Applied to Metrology, (18 April 1978); doi: 10.1117/12.956168; https://doi.org/10.1117/12.956168

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