26 September 1978 Surface Evaluation Techniques For Optical Components
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Proceedings Volume 0140, Optical Coatings: Applications and Utilization II; (1978); doi: 10.1117/12.956266
Event: 1978 Technical Symposium East, 1978, Washington, D.C., United States
Abstract
Maximum energy throughput, good image forming qualities, and low scattered light levels are all desirable in high performance optical systems. Mirrors need to have a good optical figure, high reflectance, and low scatter. Windows and other transmitting optics should have low intrinsic absorption, low surface absorption and scatter, minimum bulk scattering, and a good optical figure. Optical figure is usually readily evaluated, but microroughness and scratches and digs which affect optical scattering are more difficult to measure quantitatively. This paper presents a brief description of several optical characterization techniques which include methods for measuring surface microtopography, scattered light, absolute reflectance, change in reflectance with temperature, and optical absorption. In addition, an objective, nondestructive technique which can supplement or eliminate visual scratch/dig measurements is discussed.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. L. Decker, J. M. Bennett, "Surface Evaluation Techniques For Optical Components", Proc. SPIE 0140, Optical Coatings: Applications and Utilization II, (26 September 1978); doi: 10.1117/12.956266; https://doi.org/10.1117/12.956266
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KEYWORDS
Light scattering

Absorption

Surface finishing

Reflectivity

Scattering

Silver

Optical components

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