8 August 1978 Characteristics Of Bismuth (BI) Photopot Position-Sensing Detectors And Their Use In Adaptive Optical Systems
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Proceedings Volume 0141, Adaptive Optical Components I; (1978) https://doi.org/10.1117/12.956518
Event: 1978 Technical Symposium East, 1978, Washington, D.C., United States
Abstract
This paper describes measured characteristics of Bismuth thin film detector assemblies as they are used in different laser power and laser beam centroid position measuring applications. These uncooled detectors are insensitive to wavelength over a wide range of the spectrum (visible and infrared to at least 10.6 microns) and they have relatively wide bandwidth characteristics, that make them very useful in many applications.
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Stephen R. Aiken, "Characteristics Of Bismuth (BI) Photopot Position-Sensing Detectors And Their Use In Adaptive Optical Systems", Proc. SPIE 0141, Adaptive Optical Components I, (8 August 1978); doi: 10.1117/12.956518; https://doi.org/10.1117/12.956518
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