15 December 1978 Electro-Optical Techniques For Non-Contact Circuit Probing
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Abstract
A system was fabricated to demonstrate the utility of non-contact electro-optical switching to the testing of electronic circuit boards at the component level. This paper summarizes the results of tests on inventory avionics circuit boards and reviews the under-lying concepts for the new non-contact probing technique.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter D. Poulsen, Peter D. Poulsen, } "Electro-Optical Techniques For Non-Contact Circuit Probing", Proc. SPIE 0153, Advances in Optical Metrology I, (15 December 1978); doi: 10.1117/12.938213; https://doi.org/10.1117/12.938213
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