Shearing Interferometer With Scanned Photodiode Array And Microcomputer For Automatic Transparency Distortion Measurements

J. Taboada; A. J. Duelm

doi:10.1117/12.938229

15 December 1978 Shearing Interferometer With Scanned Photodiode Array And Microcomputer For Automatic Transparency Distortion Measurements

J. Taboada, A. J. Duelm

Author Affiliations +

Proceedings Volume 0153, Advances in Optical Metrology I; (1978) https://doi.org/10.1117/12.938229
Event: 22nd Annual Technical Symposium, 1978, San Diego, United States

Abstract

A prototype optical system is described incorporating a scanning lateral shearing interferometer, self-scanned photodiode array, electronic bandpass filter, a counter and a microprocessor for the rapid automatic testing of large area transparencies such as air-craft windscreens. Optical anomalies as small as 0.005 diopters and ranging to ± 0.2 diopters can be readily measured. The system also automatically compensates for beam deviation and displacement during the scanning process with an adaptive gimbaled mirror which provides a measure of prismatic deviation to an accuracy of about ± 0.02 degrees.

Citation Download Citation

J. Taboada and A. J. Duelm "Shearing Interferometer With Scanned Photodiode Array And Microcomputer For Automatic Transparency Distortion Measurements", Proc. SPIE 0153, Advances in Optical Metrology I, (15 December 1978); https://doi.org/10.1117/12.938229

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