15 December 1978 Shearing Interferometer With Scanned Photodiode Array And Microcomputer For Automatic Transparency Distortion Measurements
Author Affiliations +
Abstract
A prototype optical system is described incorporating a scanning lateral shearing interferometer, self-scanned photodiode array, electronic bandpass filter, a counter and a microprocessor for the rapid automatic testing of large area transparencies such as air-craft windscreens. Optical anomalies as small as 0.005 diopters and ranging to ± 0.2 diopters can be readily measured. The system also automatically compensates for beam deviation and displacement during the scanning process with an adaptive gimbaled mirror which provides a measure of prismatic deviation to an accuracy of about ± 0.02 degrees.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Taboada, J. Taboada, A. J. Duelm, A. J. Duelm, } "Shearing Interferometer With Scanned Photodiode Array And Microcomputer For Automatic Transparency Distortion Measurements", Proc. SPIE 0153, Advances in Optical Metrology I, (15 December 1978); doi: 10.1117/12.938229; https://doi.org/10.1117/12.938229
PROCEEDINGS
7 PAGES


SHARE
RELATED CONTENT

Random-phase-shift Fizeau interferometer
Proceedings of SPIE (October 03 2008)
Metal Optics For Laser Profile Scanners
Proceedings of SPIE (January 01 1987)
Design of a space qualified zoom lens for the space...
Proceedings of SPIE (October 05 1995)

Back to Top