15 December 1978 Shearing Interferometer With Scanned Photodiode Array And Microcomputer For Automatic Transparency Distortion Measurements
Author Affiliations +
Abstract
A prototype optical system is described incorporating a scanning lateral shearing interferometer, self-scanned photodiode array, electronic bandpass filter, a counter and a microprocessor for the rapid automatic testing of large area transparencies such as air-craft windscreens. Optical anomalies as small as 0.005 diopters and ranging to ± 0.2 diopters can be readily measured. The system also automatically compensates for beam deviation and displacement during the scanning process with an adaptive gimbaled mirror which provides a measure of prismatic deviation to an accuracy of about ± 0.02 degrees.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Taboada, A. J. Duelm, "Shearing Interferometer With Scanned Photodiode Array And Microcomputer For Automatic Transparency Distortion Measurements", Proc. SPIE 0153, Advances in Optical Metrology I, (15 December 1978); doi: 10.1117/12.938229; https://doi.org/10.1117/12.938229
PROCEEDINGS
7 PAGES


SHARE
RELATED CONTENT

Software-centric view on the LINC-NIRVANA beam control concept
Proceedings of SPIE (September 24 2012)
The UK FMOS spectrograph
Proceedings of SPIE (June 29 2006)
LUCIFER1: performance results
Proceedings of SPIE (August 25 2010)
Metal Optics For Laser Profile Scanners
Proceedings of SPIE (January 01 1987)
Optical Absolute Encoder Using Spatial Filter
Proceedings of SPIE (February 17 1987)

Back to Top