17 November 1978 New Instrumentation For High Temperature And Hemispherical Measurements Of Selective Surfaces
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Abstract
The proper evaluation of selective surfaces requires that their optical properties and durability be determined under simulated operating conditions. The Measurement Laboratory at the University of Arizona's Optical Sciences Center has been involved in this area for the last six years. Recent developments include: (1) A transmission cell for the high temperature reflectometer is being designed and built to measure samples at high temperatures--800°C--under vacuum or controlled atmospheres. Such samples include thin film refractory coatings suitable for concentrating collector receivers and laser mirrors deposited on transparent substrates for transmission measurements from 0.38 to about 8 μm. (2) A new data processing system has been interfaced with the existing integrating sphere reflectometer. Sample-and-hold electronics process the "triple-beamed"--sample, reference, and background--signal and pass it to a M6800 based microcomputer. The latter averages the signal until a sufficient signal-to-noise level is reached and advances the dispersive optics to the next wavelength. (3) A cylindrical vacuum emissometer for the measurement of the total hemispherical radiative power loss from a heated sample is under consideration. Coupled with existing, specially designed furnaces for lifetime testing, the Measurement Lab will provide adequate simulation capabilities for testing selective surfaces operating in most standard collector configurations. (4) A Gaertner L119 ellipsometer is being extended into the near infrared to provide measurements of optical constants of absorber materials through the solar spectrum.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. R. Jacobson, M. R. Jacobson, R. D. Lamoreaux, R. D. Lamoreaux, R. P. Shimshock, R. P. Shimshock, N. Raouf, N. Raouf, B. O. Seraphin, B. O. Seraphin, } "New Instrumentation For High Temperature And Hemispherical Measurements Of Selective Surfaces", Proc. SPIE 0161, Optics Applied to Solar Energy IV, (17 November 1978); doi: 10.1117/12.956877; https://doi.org/10.1117/12.956877
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