17 November 1978 Specularity Measurements For Solar Materials
Author Affiliations +
Proceedings Volume 0161, Optics Applied to Solar Energy IV; (1978); doi: 10.1117/12.956878
Event: 22nd Annual Technical Symposium, 1978, San Diego, United States
Abstract
A technique using Fourier transform analysis which is suitable for measuring the specularity of solar glass components in the mrad and sub-mrad is discussed and demonstrated. A brief mathematical background as well as illustrative examples are included. A number of methods for image analysis are discussed with particular emphasis given to electronic integrating detectors. Typical Fourier plane image distributions are given for a few common solar utilization materials and details of the instrument used to produce the images are considered. The limitations and capabilities of various instruments are outlined along with methods for further enhancing the utility and sensitivity of the technique.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. A. Lind, J. S. Hartman, H. L. Hampton, "Specularity Measurements For Solar Materials", Proc. SPIE 0161, Optics Applied to Solar Energy IV, (17 November 1978); doi: 10.1117/12.956878; https://doi.org/10.1117/12.956878
PROCEEDINGS
8 PAGES


SHARE
KEYWORDS
Light scattering

Scattering

Sensors

Fourier transforms

Laser scattering

Glasses

Photovoltaic materials

RELATED CONTENT


Back to Top