25 July 1979 An Automatic Fringe Analysis Interferometer for Rapid Moire Stress Analysis
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Proceedings Volume 0164, 4th European Electro-Optics Conf; (1979) https://doi.org/10.1117/12.965515
Event: Fourth European Electro-Optics Conference, 1978, Utrecht, Netherlands
In optical methods of stress analysis, the reduction of raw data to engineering quantities has proved to be a difficult problem. A portable instrument has been developed which interrogates a specimen grid point-wise using a narrow beam of coherent light, and electro-optically measures interference-fringe-spacing, in three directions simultaneously. A microprocessor is incorporated to convert the strain component values to convenient quantities such as principal stress and shear, and these are displayed. The read-rate is adjustable up to 5 kHz, the discrimination level is 4 µε, and a facility for temperature compensation is included. The logic behind the design of the major features of the unit are described.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. McKelvie, J. McKelvie, D. Pritty, D. Pritty, C. A. Walker, C. A. Walker, "An Automatic Fringe Analysis Interferometer for Rapid Moire Stress Analysis", Proc. SPIE 0164, 4th European Electro-Optics Conf, (25 July 1979); doi: 10.1117/12.965515; https://doi.org/10.1117/12.965515

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