8 May 1971 Automatic Optical Measurement Systems
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Proceedings Volume 0170, Optics in Quality Assurance II; (1971) https://doi.org/10.1117/12.957027
Event: Los Angeles Technical Symposium, 1979, Los Angeles, United States
Abstract
Programmable electro-optical measuring systems are being readily introduced to industrial inspection applications. Major improvements in the operation, measuring power and speed of the devices have served as impetus to the increase in their popularity and acceptance. The majority of system improvements have come on the wings of technological advances in individual component members; microcircuitry has dimished the size and price of components yet increased their performance and reliability. Presently solid state scanners employ dense CID matrix arrays to reduce or eliminate many of the problems associated with CCD arrays or imaging tubes. The CID lacks the resolution of either vidicon or image dissector sensors, however, measuring accuracies achieved using tube devices can be approached by the lower resolution CID through proper application of quality optics. Inexpensive floppy disk storage has further enhanced the usefulness of the newer machines by providing capacity for unlimited programs and data storage.
© (1971) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M.Thomas Jackson, M.Thomas Jackson, } "Automatic Optical Measurement Systems", Proc. SPIE 0170, Optics in Quality Assurance II, (8 May 1971); doi: 10.1117/12.957027; https://doi.org/10.1117/12.957027
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