4 April 1979 A High Accuracy Surface Contour Measuring Machine
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Proceedings Volume 0171, Optical Components: Manufacture and Evaluation; (1979) https://doi.org/10.1117/12.957049
Event: Los Angeles Technical Symposium, 1979, Los Angeles, United States
Abstract
A surface contour measuring machine is described which can measure general aspheric or axi-symmetric aspheric surfaces repeatably to .000005 inches or better in most cases. The computer system which controls the measuring machine and which performs the data analysis is discussed. Aspheric production applications are shown in which the measuring machine plays a vital role.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel Bajuk, "A High Accuracy Surface Contour Measuring Machine", Proc. SPIE 0171, Optical Components: Manufacture and Evaluation, (4 April 1979); doi: 10.1117/12.957049; https://doi.org/10.1117/12.957049
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