4 April 1979 Analysis Of Interferograms From Waxicons
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Proceedings Volume 0171, Optical Components: Manufacture and Evaluation; (1979) https://doi.org/10.1117/12.957046
Event: Los Angeles Technical Symposium, 1979, Los Angeles, United States
Abstract
Axicon elements are used in cylindrical optical systems such as high-power chemical lasers. Interferometric tests of such elements cannot be interpreted by standard methods. Axicon aberrations of cone error and decenter error are defined to help interpret such interferograms. A preprocessing option was added to FRINGE to treat axicon data. An example interferogram has been analyzed.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John S. Loomis, John S. Loomis, } "Analysis Of Interferograms From Waxicons", Proc. SPIE 0171, Optical Components: Manufacture and Evaluation, (4 April 1979); doi: 10.1117/12.957046; https://doi.org/10.1117/12.957046
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