4 April 1979 In SITU Bidirectional Reflectance Distribution Function (BRDF) Measurement Facility
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Proceedings Volume 0171, Optical Components: Manufacture and Evaluation; (1979) https://doi.org/10.1117/12.957048
Event: Los Angeles Technical Symposium, 1979, Los Angeles, United States
Abstract
The angular distribution of light scattered from optical surfaces is best described by a Bidirectional Reflectance Distribution Function (BRDF). Scattered light in spaceborne optical systems may be induced by surface contaminants that are present only under the combined conditions of extreme cold, high vacuum, and strong ultraviolet radiation. An instrument is described that gqnerates surface contaminants and measures BRDF in situ. Measurements are performed at 10-0 Tarr pressure and at 77K for angular scatter ranging from one degree away from the specular reflected beam to sixty degrees away from the specular reflected beam. Measured BRDF intensity ranges from 10-° watt per incident watt per steradian to 10-6 watt per incident watt per steradian.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. M. Kale, B. M. Kale, Barry Broome, Barry Broome, } "In SITU Bidirectional Reflectance Distribution Function (BRDF) Measurement Facility", Proc. SPIE 0171, Optical Components: Manufacture and Evaluation, (4 April 1979); doi: 10.1117/12.957048; https://doi.org/10.1117/12.957048
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