17 July 1979 Use Of 436 NM Optical Step-And-Repeat Imaging For Wafer Fabrication
Author Affiliations +
Abstract
The use of a 10X reduction step and repeat system to produce 1 to gum geometries over a 14.5mm diameter image for high density semiconductor wafer fabrication is presented. The impact of standing wave patterns on the development properties of photoresists are examined for substrates of various reflectivity, and efforts to minimize these effects described. Data on alignment accuracies and critical dimension tolerances is also included.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Geoffrey R.M. Thomas, Harry L. Coleman, Mike Lanahan, "Use Of 436 NM Optical Step-And-Repeat Imaging For Wafer Fabrication", Proc. SPIE 0174, Developments in Semiconductor Microlithography IV, (17 July 1979); doi: 10.1117/12.957173; https://doi.org/10.1117/12.957173
PROCEEDINGS
7 PAGES


SHARE
Back to Top