Multiwavelength Feature Detection And Recognition

R. H. Kin; H. F. Williams; D. L. Hench

doi:10.1117/12.957275

20 August 1979 Multiwavelength Feature Detection And Recognition

R. H. Kin, H. F. Williams, D. L. Hench

Proceedings Volume 0178, Smart Sensors; (1979) https://doi.org/10.1117/12.957275
Event: Technical Symposium East, 1979, Washington, D.C., United States

Abstract

The Rockwell Pattern Matcher (RPM) is a feature based technique which has been demonstrated on multi-wavelength imagery. Feature extraction and image matches have been performed on imagery from 3 cm Synthetic Aperture Radar (SAR), 3.2 mm active radar, 10.6 u active laser, 8-12 u passive IR and optical photographs. The feature detection, recognition and image matches were performed on imagery of the same wavelength as well as on those using a different wavelength as the reference scene. The capability of the RPM algorithm to operate on images generated from a wide spectrum of wavelengths allows its utilization for a variety of applications. The versatility and robustness of the Rockwell algorithm gives rise to the advent of "smart sensors" to achieve functions not previously attainable.

Citation Download Citation

R. H. Kin, H. F. Williams, and D. L. Hench "Multiwavelength Feature Detection And Recognition", Proc. SPIE 0178, Smart Sensors, (20 August 1979); https://doi.org/10.1117/12.957275

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