4 October 1979 System Acceptance Testing Utilizing an Interferometer
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Proceedings Volume 0187, System Aspects of Electro-optics; (1979) https://doi.org/10.1117/12.965586
Event: 1979 Huntsville Technical Symposium, 1979, Huntsville, United States
Abstract
This paper describes how system acceptance testing can be performed utilizing an inter-ferometer both for subsystem and final system performance requirements. The performance of optical systems can usually be translated into wavefront specifications. Specific instrumentation described using these types of tests include scanning mirror assemblies, zoom lenses, alignment telescopes, spotting scopes, and various types of other image forming instruments.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Walter H. Augustyn "System Acceptance Testing Utilizing an Interferometer", Proc. SPIE 0187, System Aspects of Electro-optics, (4 October 1979); doi: 10.1117/12.965586; https://doi.org/10.1117/12.965586
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