27 July 1979 Flash X-Ray Diffraction Study During Shock-Compression
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Proceedings Volume 0189, 13th Intl Congress on High Speed Photography and Photonics; (1979) https://doi.org/10.1117/12.957594
Event: 13th International Congress on High Speed Photography and Photonics, 1978, Tokyo, Japan
Abstract
Flash X-ray diffraction (FXD) study was performed during shock-compression by using the Blumlein FX source and an image intensifier. The dimension of this Blumlein body is approximately 6 m in length and 0.2 m in diameter. The electric pulse is 80 nsec wide but the real X-ray pulse is estimated to have a width of a few 10 nsec. The optimum condition of electrode dimensions for X-ray radiation was determined. The delay and jitter to trigger the FX source were also determined to synchronize the X-ray pulse pre-cisely with the arrival of the shock front. FXD patterns of LiF during shock-compression have been obtained up to 50 GPa.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. Kondo, K. Kondo, A. Sawaoka, A. Sawaoka, S. Saito, S. Saito, } "Flash X-Ray Diffraction Study During Shock-Compression", Proc. SPIE 0189, 13th Intl Congress on High Speed Photography and Photonics, (27 July 1979); doi: 10.1117/12.957594; https://doi.org/10.1117/12.957594
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