13 November 1980 Optical Diagnostic System For Observation Of Laser-Produced Shock Waves
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Proceedings Volume 0190, Los Alamos Conference on Optics 1979; (1980) https://doi.org/10.1117/12.957774
Event: Los Alamos Conference on Optics '79, 1979, Los Alamos, United States
Abstract
Several standard plasma and gas dynamic diagnostic techniques have been integrated into a system for observing the formation and propagation of high-power Nd:glass-laser generated one- and two-dimensional shockwaves in air from 0.1 torr to atmospheric pres-sures. Diagnostics include either single-frame, two-wavelength holographic ruby-laser interferometry or single-frame, single-wavelength interferometry with ten frames of shadow-graphy. Streaks or ten frames of the early luminous shocked region also are taken on all shots, as well as time-resolved luminosity measurements using high-speed biplanar vacuum photodiodes with various wavelength interference filters. Shadowgraphy frames are 200-ns long at 1-μs intervals, while emission frames are variable with a maximum 10-ns exposure and 50-ns interval. Both the streak mode and emission measurements with the vacuum diode allow subnanosecond time resolution. The interferometry provides 20-ns exposures from 500 ns to late times. Methods for reducing and interpreting the data have been, or are currently being, developed. Interactive computer programs for digitizing the fringe patterns provide fringe-shift profiles for Abel inversion. This has provided neutral gas and electron density information in the spherical, one-dimensional cases. Diagrams and photographs of the experiment will be shown as well as examples of the data that have been taken. Methods for data reduction will be outlined and some of the results shown.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mark D. Wilke, Mark D. Wilke, Sidney N. Stone, Sidney N. Stone, } "Optical Diagnostic System For Observation Of Laser-Produced Shock Waves", Proc. SPIE 0190, Los Alamos Conference on Optics 1979, (13 November 1980); doi: 10.1117/12.957774; https://doi.org/10.1117/12.957774
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