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13 November 1980 Scatterplate Interferometry: A Diffraction Theory
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Proceedings Volume 0190, Los Alamos Conference on Optics 1979; (1980)
Event: Los Alamos Conference on Optics '79, 1979, Los Alamos, United States
The Burch scatterplate interferometer is an extremely precise, equal path interferometer that provides direct wavefront information without the use of any precision optical components. This paper describes the use of Fourier transform techniques to provide a straightforward scalar diffraction theory of the interferometer. The results show the characteristic hot spot and speckle pattern seen in scatterplate interferograms. Practical applications of the theory are also discussed.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. A. Johnson and John Hayes "Scatterplate Interferometry: A Diffraction Theory", Proc. SPIE 0190, Los Alamos Conference on Optics 1979, (13 November 1980);

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