PROCEEDINGS VOLUME 0192
23RD ANNUAL TECHNICAL SYMPOSIUM | 27-30 AUGUST 1979
Interferometry
Editor(s): George W. Hopkins
IN THIS VOLUME

1 Sessions, 37 Papers, 0 Presentations
All Papers  (37)
23RD ANNUAL TECHNICAL SYMPOSIUM
27-30 August 1979
San Diego, United States
All Papers
Proc. SPIE 0192, Interferometric Optical Testing: Past, Present And Future, 0000 (25 December 1979); https://doi.org/10.1117/12.957829
Proc. SPIE 0192, Infrared Laser Interferometer, 0000 (25 December 1979); https://doi.org/10.1117/12.957830
Proc. SPIE 0192, Versatile Interferometer For Shop Use, 0000 (25 December 1979); https://doi.org/10.1117/12.957831
Proc. SPIE 0192, Theory And Application Of Laser Interferometer Systems, 0000 (25 December 1979); https://doi.org/10.1117/12.957832
Proc. SPIE 0192, Scatterplate Interferometry, 0000 (25 December 1979); https://doi.org/10.1117/12.957833
Proc. SPIE 0192, Special Applications Of The Point-Diffraction Interferometer, 0000 (25 December 1979); https://doi.org/10.1117/12.957834
Proc. SPIE 0192, The Zygo Interferometer System, 0000 (25 December 1979); https://doi.org/10.1117/12.957835
Proc. SPIE 0192, Applications Of Computer-Controlled Interferometry In The Optical Shop, 0000 (25 December 1979); https://doi.org/10.1117/12.957836
Proc. SPIE 0192, Interferometric Testing In A Precision Optics Shop: A Review Of Testplate Testing, 0000 (25 December 1979); https://doi.org/10.1117/12.957837
Proc. SPIE 0192, Precise Optical Evaluation Using Phase Measuring Interferometric Techniques, 0000 (25 December 1979); https://doi.org/10.1117/12.957838
Proc. SPIE 0192, Differential Technique For Accurately Measuring The Radius Of Curvature Of Long Radius Concave Optical Surfaces, 0000 (25 December 1979); https://doi.org/10.1117/12.957839
Proc. SPIE 0192, Interferometric Instrumentation As A Cost-Effective Production Tool, 0000 (25 December 1979); https://doi.org/10.1117/12.957840
Proc. SPIE 0192, Long-Wavelength Interferometer In The Optical Shop, 0000 (25 December 1979); https://doi.org/10.1117/12.957841
Proc. SPIE 0192, Vibration Insensitive Laser Unequal Path Interferometer (LUPI) Test, 0000 (25 December 1979); https://doi.org/10.1117/12.957842
Proc. SPIE 0192, Use Of The Laser Interferometer For Position Feedback, 0000 (25 December 1979); https://doi.org/10.1117/12.957843
Proc. SPIE 0192, Production Interferometric Testing Of Diamond-Turned Surfaces, 0000 (25 December 1979); https://doi.org/10.1117/12.957844
Proc. SPIE 0192, Development Of An Accurate Mirror Fiducial System Compatible With Computer-Controlled Polishing Methods, 0000 (25 December 1979); https://doi.org/10.1117/12.957845
Proc. SPIE 0192, Versatility Of A Microprocessor-Based Interferometric Data Reduction System, 0000 (25 December 1979); https://doi.org/10.1117/12.957846
Proc. SPIE 0192, Microprocessor-Based Instrument For Analyzing Video Interferograms, 0000 (25 December 1979); https://doi.org/10.1117/12.957847
Proc. SPIE 0192, Method Of Testing Complex Aspheric Mirrors Using Phase-Measuring Interferometric Techniques, 0000 (25 December 1979); https://doi.org/10.1117/12.957848
Proc. SPIE 0192, Inexpensive Large-Aperture Interferometer, 0000 (25 December 1979); https://doi.org/10.1117/12.957849
Proc. SPIE 0192, Noncontact, Laser Interferometer Sweep Gage, 0000 (25 December 1979); https://doi.org/10.1117/12.957850
Proc. SPIE 0192, Electronic Heterodyne Recording Of Interference Patterns, 0000 (25 December 1979); https://doi.org/10.1117/12.957851
Proc. SPIE 0192, Measurement Of Two-Dimensional Optical System Modulation Transfer Function (MTF) By Computation Of Second Order Speckle Statistics, 0000 (25 December 1979); https://doi.org/10.1117/12.957852
Proc. SPIE 0192, Measurement Of Spatial Coherence Using Correlated Diffusers, 0000 (25 December 1979); https://doi.org/10.1117/12.957853
Proc. SPIE 0192, One-Step Rainbow Holographic Interferometry, 0000 (25 December 1979); https://doi.org/10.1117/12.957854
Proc. SPIE 0192, Two-Wavelength Contouring With The Automated Thermoplastic Holographic Camera, 0000 (25 December 1979); https://doi.org/10.1117/12.957855
Proc. SPIE 0192, Real-Time Holographic Interferometry With Pulsed Laser, 0000 (25 December 1979); https://doi.org/10.1117/12.957856
Proc. SPIE 0192, Interferometry Through Single-Mode Optical Fibers, 0000 (25 December 1979); https://doi.org/10.1117/12.957857
Proc. SPIE 0192, Double Michelson Interferometer For Contactless Thermal Expansion Measurements, 0000 (25 December 1979); https://doi.org/10.1117/12.957858
Proc. SPIE 0192, Holographic Interferometry For Study On Hearing Mechanism And Combination With Optical Fibers, 0000 (25 December 1979); https://doi.org/10.1117/12.957859
Proc. SPIE 0192, Bonded Interface Surface Testing Via Differential Interferometric Stoneley Wave Measurements, 0000 (25 December 1979); https://doi.org/10.1117/12.957860
Proc. SPIE 0192, Development Of Nomarski Microscopy For Quantitative Determination Of Surface Topography(A), 0000 (25 December 1979); https://doi.org/10.1117/12.957861
Proc. SPIE 0192, Interferometric Measurement Of Truss Joint Design Strengths, 0000 (25 December 1979); https://doi.org/10.1117/12.957862
Proc. SPIE 0192, Low-Cost High-Resolution Spectral Measurements Of Solar And Atmospheric Lines Using A Commercially Available Scanning Interferometer, 0000 (25 December 1979); https://doi.org/10.1117/12.957863
Proc. SPIE 0192, Interferometric Characterization Of Cryogenic Targets In A Laser-Fusion Target Chamber, 0000 (25 December 1979); https://doi.org/10.1117/12.957864
Proc. SPIE 0192, Blazed Holographic Gratings By Selective Etching In Silicon, 0000 (25 December 1979); https://doi.org/10.1117/12.957865
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