PROCEEDINGS VOLUME 0196
23RD ANNUAL TECHNICAL SYMPOSIUM | 27-30 AUGUST 1979
Measurements of Optical Radiations
IN THIS VOLUME

1 Sessions, 22 Papers, 0 Presentations
All Papers  (22)
23RD ANNUAL TECHNICAL SYMPOSIUM
27-30 August 1979
San Diego, United States
All Papers
Proc. SPIE 0196, Spectral Radiometric Measurements For High Temperature Solar Applications, 0000 (15 November 1979); https://doi.org/10.1117/12.957950
Proc. SPIE 0196, Multiband Radiometer For Field Research, 0000 (15 November 1979); https://doi.org/10.1117/12.957951
Proc. SPIE 0196, Calibration Procedures For Measurement Of Reflectance Factor In Remote Sensing Field Research, 0000 (15 November 1979); https://doi.org/10.1117/12.957952
Proc. SPIE 0196, Narrow-Field Radiometry In A Quasi-Isotropic Atmosphere, 0000 (15 November 1979); https://doi.org/10.1117/12.957953
Proc. SPIE 0196, Diver-Operable Multiwavelength Radiometer, 0000 (15 November 1979); https://doi.org/10.1117/12.957954
Proc. SPIE 0196, High-Resolution Optical Telescope For Ultraviolet (UV) Radiation Field, 0000 (15 November 1979); https://doi.org/10.1117/12.957955
Proc. SPIE 0196, Evaluation Of Silicon Diode Arrays For The High-Resolution Spectrograph (HRS) Digicon, 0000 (15 November 1979); https://doi.org/10.1117/12.957956
Proc. SPIE 0196, Microprocessor-Based Spectral Responsivity Calibration System For Photosensors, 0000 (15 November 1979); https://doi.org/10.1117/12.957957
Proc. SPIE 0196, On The Possibility Of An Absolute Radiometric Standard Based On The Quantum Efficiency Of A Silicon Photodiode, 0000 (15 November 1979); https://doi.org/10.1117/12.957958
Proc. SPIE 0196, Measurement Of Synchrotron Radiation From The NBS SURF II Using A Silicon Radiometer, 0000 (15 November 1979); https://doi.org/10.1117/12.957959
Proc. SPIE 0196, Thin-Film Scintillators For Extended Ultraviolet (UV) Response Silicon Detectors, 0000 (15 November 1979); https://doi.org/10.1117/12.957960
Proc. SPIE 0196, Measurement Of Low Level Laser Pulses At 1.064 µm, 0000 (15 November 1979); https://doi.org/10.1117/12.957961
Proc. SPIE 0196, Direct Measure Of Cathode-Ray Tube (CRT) Image Quality, 0000 (15 November 1979); https://doi.org/10.1117/12.957962
Proc. SPIE 0196, Computer-Controlled Photometry And Large-Screen Display Resolution, 0000 (15 November 1979); https://doi.org/10.1117/12.957963
Proc. SPIE 0196, Unique Optical System For Conversion Of Existing Photometers Into Scanning Microphotometers, 0000 (15 November 1979); https://doi.org/10.1117/12.957964
Proc. SPIE 0196, Laser Spatial Profile Measurement Device, 0000 (15 November 1979); https://doi.org/10.1117/12.957965
Proc. SPIE 0196, Accuracy In The Photometry Of Retroreflectors, 0000 (15 November 1979); https://doi.org/10.1117/12.957966
Proc. SPIE 0196, Spectroradiometric Testing Of Antireflection Coatings, 0000 (15 November 1979); https://doi.org/10.1117/12.957967
Proc. SPIE 0196, Cavity Radiometer Reflectance, 0000 (15 November 1979); https://doi.org/10.1117/12.957968
Proc. SPIE 0196, Two-Scatter-Plate Integrator To Reduce Speckle Noise, 0000 (15 November 1979); https://doi.org/10.1117/12.957969
Proc. SPIE 0196, Measurement Of Nanosecond Laser Pulse Characteristics Transiting An Underwater Path, 0000 (15 November 1979); https://doi.org/10.1117/12.957970
Proc. SPIE 0196, Versatile Method For Measuring Absolute Grating Efficiencies, 0000 (15 November 1979); https://doi.org/10.1117/12.957971
Back to Top