15 November 1979 Laser Spatial Profile Measurement Device
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Abstract
A device is described which measures the spatial profile of a laser in either the near field or far field. The laser pattern is imaged onto a pyroelectric vidicon (PEV) camera. A single frame is extracted from the camera and the image is processed using a PDP 11/20 to correct for PEV imperfections. The device will measure lasers having wavelengths of 2 µm to 10.6 µm. Detailed characteristics of the device are given.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William R. Mallory, William R. Mallory, Francis X. Jeskie, Francis X. Jeskie, W. Lee Blanton, W. Lee Blanton, } "Laser Spatial Profile Measurement Device", Proc. SPIE 0196, Measurements of Optical Radiations, (15 November 1979); doi: 10.1117/12.957965; https://doi.org/10.1117/12.957965
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