A device is described which measures the spatial profile of a laser in either the near field or far field. The laser pattern is imaged onto a pyroelectric vidicon (PEV) camera. A single frame is extracted from the camera and the image is processed using a PDP 11/20 to correct for PEV imperfections. The device will measure lasers having wavelengths of 2 µm to 10.6 µm. Detailed characteristics of the device are given.