PROCEEDINGS VOLUME 0210
OPTICS, PHOTONICS, AND ICONICS ENGINEERING MEETING | 26-30 NOVEMBER 1979
2nd European Congress on Optics Applied to Metrology
IN THIS VOLUME

1 Sessions, 32 Papers, 0 Presentations
All Papers  (32)
OPTICS, PHOTONICS, AND ICONICS ENGINEERING MEETING
26-30 November 1979
Strasbourg, France
All Papers
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 2 (20 May 1980); doi: 10.1117/12.958307
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 10 (20 May 1980); doi: 10.1117/12.958308
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 18 (20 May 1980); doi: 10.1117/12.958309
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 25 (20 May 1980); doi: 10.1117/12.958310
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 29 (20 May 1980); doi: 10.1117/12.958312
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 36 (20 May 1980); doi: 10.1117/12.958313
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 48 (20 May 1980); doi: 10.1117/12.958314
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 54 (20 May 1980); doi: 10.1117/12.958315
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 65 (20 May 1980); doi: 10.1117/12.958316
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 70 (20 May 1980); doi: 10.1117/12.958317
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 77 (20 May 1980); doi: 10.1117/12.958318
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 82 (20 May 1980); doi: 10.1117/12.958319
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 88 (20 May 1980); doi: 10.1117/12.958320
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 96 (20 May 1980); doi: 10.1117/12.958321
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 102 (20 May 1980); doi: 10.1117/12.958322
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 107 (20 May 1980); doi: 10.1117/12.958323
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 116 (20 May 1980); doi: 10.1117/12.958324
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 123 (20 May 1980); doi: 10.1117/12.958325
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 128 (20 May 1980); doi: 10.1117/12.958326
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 135 (20 May 1980); doi: 10.1117/12.958327
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 140 (20 May 1980); doi: 10.1117/12.958328
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 144 (20 May 1980); doi: 10.1117/12.958329
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 154 (20 May 1980); doi: 10.1117/12.958330
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 159 (20 May 1980); doi: 10.1117/12.958331
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 165 (20 May 1980); doi: 10.1117/12.958332
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 173 (20 May 1980); doi: 10.1117/12.958333
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 178 (20 May 1980); doi: 10.1117/12.958334
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 188 (20 May 1980); doi: 10.1117/12.958335
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 196 (20 May 1980); doi: 10.1117/12.958336
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 203 (20 May 1980); doi: 10.1117/12.958337
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 207 (20 May 1980); doi: 10.1117/12.958338
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, pg 213 (20 May 1980); doi: 10.1117/12.958339
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