Paper
20 May 1980 Optical Metrologic Evaluation Of Cotton Fabrics
Y. Magoshi, B. Lotz, P. Meyrueis
Author Affiliations +
Proceedings Volume 0210, 2nd European Congress on Optics Applied to Metrology; (1980) https://doi.org/10.1117/12.958318
Event: Optics, Photonics, and Iconics Engineering Meeting, 1979, Strasbourg, France
Abstract
A variety of cotton fabrics (twills, velvets, moleskin, and satin) have been analyzed by means of Frauenhofer patterns. While determination of geometrical parameters is possible, it appears that cotton fabrics, and for that matter, most fabrics made of natural fibers, are less suited for analysis by optical methods than spun filaments (i.e. artificial fibers and silk) due to an important contribution to scattering of the small fibrils which give the yarns their shagginess.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Y. Magoshi, B. Lotz, and P. Meyrueis "Optical Metrologic Evaluation Of Cotton Fabrics", Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, (20 May 1980); https://doi.org/10.1117/12.958318
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KEYWORDS
Diffraction

Metrology

Photography

Optical fibers

Computing systems

Geometrical optics

Scattering

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