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14 May 1980 Advances and Applications of Electronic Speckle Pattern Interferometry (ESPI)
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Proceedings Volume 0215, Recent Advances in Holography; (1980) https://doi.org/10.1117/12.958425
Event: 1980 Los Angeles Technical Symposium, 1980, Los Angeles, United States
Abstract
The principle of Electronic Speckle Pattern Interferometry - ESPI - is explained by comparing it to image holography where recording and reconstruction are performed by videotechniques. As such, ESPI can be used for different interferometric measurements, but it is especially suitable for vibration testing and measurement of movements. Our work on extending the measuring range and general use of ESPI for those purposes is described and illustrated by some practical applications.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ole J. Lokberg "Advances and Applications of Electronic Speckle Pattern Interferometry (ESPI)", Proc. SPIE 0215, Recent Advances in Holography, (14 May 1980); https://doi.org/10.1117/12.958425
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