25 April 1980 Use Of Pockers Readout Optical Modulators (PROMS) For Atomic Resolution Electron Image Processing
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Proceedings Volume 0218, Devices and Systems for Optical Signal Processing; (1980) https://doi.org/10.1117/12.958520
Event: 1980 Los Angeles Technical Symposium, 1980, Los Angeles, United States
Abstract
The usefulness of PROMS for high resolution electron microscopy is outlined. A theoretical model for direct electron beam image storage in PROMS is given, and computed results discussed. Wear-atomic resolution electron images of the Bi12Si020 crystal structure are shown and discussed.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J.C. H. Spence, A . Olsen, "Use Of Pockers Readout Optical Modulators (PROMS) For Atomic Resolution Electron Image Processing", Proc. SPIE 0218, Devices and Systems for Optical Signal Processing, (25 April 1980); doi: 10.1117/12.958520; https://doi.org/10.1117/12.958520
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