28 May 1980 Computerized Measuring Microscope
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Proceedings Volume 0220, Optics in Metrology and Quality Assurance; (1980) https://doi.org/10.1117/12.958591
Event: 1980 Los Angeles Technical Symposium, 1980, Los Angeles, United States
Abstract
In the manufacturing of printed circuit boards, microscopic analysis is an essential process control activity. An inspector microscopically analyzes board samples to deter-mine board lot quality and process conditions. Prior to computerizing, this sustained measurement-taking involved the tedious process of recording raw data, converting microscope filar readings, calculating averages, logging information in a job notebook, and completing detailed final lab reports. It is evident from this brief task description that this time-consuming repetitious data recording routine was an added burden to the already fatiguing visual inspection method and therefore was a prime candidate for automatic data capture and printout. Secondly, the creation of a permanent and easily accessible data base would improve process feedback and provide for a system with quick identification of any suspect boards if further assembly/testing exhibited board-related failures. This paper describes the evolution and implementation of a computer-aided microscopic inspection operation.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thomas D. Schoonmaker, "Computerized Measuring Microscope", Proc. SPIE 0220, Optics in Metrology and Quality Assurance, (28 May 1980); doi: 10.1117/12.958591; https://doi.org/10.1117/12.958591
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