28 May 1980 Direct Phase Measurement In Spherical Wave Fizeau Interferometers
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Proceedings Volume 0220, Optics in Metrology and Quality Assurance; (1980) https://doi.org/10.1117/12.958582
Event: 1980 Los Angeles Technical Symposium, 1980, Los Angeles, United States
Abstract
For generations optical technicians have judged the accuracy of an optical surface by estimating the straightness of the fringes in an interference pattern. The eye, however, is not capable of estimating fringe straightness accurately enough to satisfy present-day demands for twentieth-wave or hundredth-wave accuracy. More rigorous quantitative methods must be used to attain the desired precision. Digital analysis of photographs is a help but the data obtained from photographs are noisy and such a method is greatly influenced by distortion in the imaging system and the problems associated with the necessity of providing many closely spaced fringes for analysis.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert C. Moore, Robert C. Moore, Frank H. Slaymaker, Frank H. Slaymaker, } "Direct Phase Measurement In Spherical Wave Fizeau Interferometers", Proc. SPIE 0220, Optics in Metrology and Quality Assurance, (28 May 1980); doi: 10.1117/12.958582; https://doi.org/10.1117/12.958582
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