28 May 1980 Inferential Physical Measurements Using Detectors And Detector Arrays
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Proceedings Volume 0220, Optics in Metrology and Quality Assurance; (1980) https://doi.org/10.1117/12.958578
Event: 1980 Los Angeles Technical Symposium, 1980, Los Angeles, United States
Abstract
Some uses of photodiode detector arrays for on-line inferential measurement of process parameters are described in this paper. Optical considerations involving these arrays are discussed. High resolution camera lenses are not necessarily best in these applications since different lens design considerations apply when discrete arrays are used. Serious linearity and repeatability problems that were encountered with some commercially available solid state camera systems are discussed. The requirement of modest system cost, coupled with the need for high speed on line analysis, place stringent restrictions on the type and amount of computer analysis that can be carried out. A set of recognition algorithms which have worked well in the initial applications are described. Some of the remaining problems, and possible approaches to them, are presented.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fred Abbott, Fred Abbott, K. K. Burhardt, K. K. Burhardt, F. M. Waltz, F. M. Waltz, } "Inferential Physical Measurements Using Detectors And Detector Arrays", Proc. SPIE 0220, Optics in Metrology and Quality Assurance, (28 May 1980); doi: 10.1117/12.958578; https://doi.org/10.1117/12.958578
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