6 August 1980 Focal Plane Testing From A Production Point Of View: A Tutorial
Author Affiliations +
Proceedings Volume 0225, Infrared Image Sensor Technology; (1980) https://doi.org/10.1117/12.958709
Event: 1980 Technical Symposium East, 1980, Washington, D.C., United States
Focal plane production testing to be cost and schedule effective involves many tradeoffs which appear very difficult to optimize. This optimization appears particularly difficult for the more sophisticated devices which have detailed and interactive specifications. These tradeoffs will be broken down into major categories with clear optimization procedures and guidelines provided so that their individual impacts will be more easily understood. Production yields of focal planes can be significantly increased and costs reduced - the technology and techniques are at hand. The manufacturers ability can be further optimized through wise, concise testing at cryogenic temperatures which has long been an industry bottleneck. The six major categories to be discussed are: 1) Go/No Go Testing; 2) Characterization; 3) Specification vs Performance and Cost Tradeoffs; 4) Earliest Significant Testing; 5) Room and Cryogenic Temperature Testing and 6) Self and Diagnostic Testing. Practical examples will be shown to demonstrate the basic techniques so that a firm foundation of each of the major categories will be obtained.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. F. Schmunk, A. H. Marshall, R. J. Sonners, "Focal Plane Testing From A Production Point Of View: A Tutorial", Proc. SPIE 0225, Infrared Image Sensor Technology, (6 August 1980); doi: 10.1117/12.958709; https://doi.org/10.1117/12.958709


Pulse-bias Mosaic Test Data And Subassembly Configuratior
Proceedings of SPIE (August 06 1980)
Evaluation Of Flight Data From A Mosaic Sensor
Proceedings of SPIE (August 06 1980)
Focal-Plane Evaluation
Proceedings of SPIE (August 06 1980)
Overview Of Blackbody Radiation Sources
Proceedings of SPIE (December 28 1982)
Worldwide phase management process
Proceedings of SPIE (May 12 1992)

Back to Top