24 June 1980 Effects Of Reflected Background Radiation On Radiometric Temperature Measurement
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Proceedings Volume 0226, Infrared Imaging Systems Technology; (1980) https://doi.org/10.1117/12.958732
Event: 1980 Technical Symposium East, 1980, Washington, D.C., United States
A method for evaluatina the contribution of background flux reflected from a sample is shown. An example is described showing that the reflected background contribution in a thermographic examination is about 2% and the effect of opening a window is about 0.5%.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William L. Wolfe, William L. Wolfe, } "Effects Of Reflected Background Radiation On Radiometric Temperature Measurement", Proc. SPIE 0226, Infrared Imaging Systems Technology, (24 June 1980); doi: 10.1117/12.958732; https://doi.org/10.1117/12.958732


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