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8 August 1980 Calculator-Assisted Evaluation Of Reflectance Characteristics Of Fluorescent Films
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Proceedings Volume 0230, Minicomputers and Microprocessors in Optical Systems; (1980) https://doi.org/10.1117/12.958808
Event: 1980 Technical Symposium East, 1980, Washington, D.C., United States
Abstract
The reflection properties of opaque fluorescent materials are measured with a 450/00 (illumination-viewing) spectroradiometer system interfaced to a desktop calculator. These measured values are then used to determine the samples' chromaticity coordinates and the fluorescent contribution to the radiance factor. To obtain these parameters, the calculator is used to optimize the design of an illuminant D-65 simulator; accept data for instrument calibration and reflectance measurements; calculate the sample's chromaticity coordinates; and graphically display the sample's non-fluorescent and total radiance factors. The performance requirements and chromaticity coordinates of a sample are displayed on a computer prepared plot to aid in evaluating a material's conformance to desired specifications.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ray K. Kostuk "Calculator-Assisted Evaluation Of Reflectance Characteristics Of Fluorescent Films", Proc. SPIE 0230, Minicomputers and Microprocessors in Optical Systems, (8 August 1980); https://doi.org/10.1117/12.958808
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