22 August 1980 Analysis Of Martian Terrains Using Optical Power Spectra
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Proceedings Volume 0232, 1980 Intl Optical Computing Conf II; (1980); doi: 10.1117/12.958887
Event: 1980 Technical Symposium East, 1980, Washington, D.C., United States
Abstract
Planetary geological studies are almost entirely based on the analysis of orbital imagery. In the case of Mars, optical power spectra are providing the photogeologist with an additional aid in his task of classification and characterization of diverse terrains. Statistical pattern recognition techniques using optical power spectral data may be especially valuable in subdividing terrain units with characteristics that are only subtly different and in correlation of isolated patches of similar materials that are widely separated on the planet's surface.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert W. Wolfe, Stephen Kaplan, "Analysis Of Martian Terrains Using Optical Power Spectra", Proc. SPIE 0232, 1980 Intl Optical Computing Conf II, (22 August 1980); doi: 10.1117/12.958887; https://doi.org/10.1117/12.958887
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KEYWORDS
Diffraction

Mars

Sensors

Pattern recognition

Planets

Algorithm development

Optical computing

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