18 November 1980 Measurement Of Fluorescent Radiation From Opaque Surfaces
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Proceedings Volume 0234, New Developments and Applications in Optical Radiation Measurement; (1980) https://doi.org/10.1117/12.958945
Event: New Developments and Applications in Optical Radiation Measurement, 1980, Teddington, United Kingdom
The complete radiometric analysis of a fluorescent opaque sample is described. Conventionally, the spectral analysis of reflected radiation from a non-fluorescent opaque object is made by comparing the radiation reflected from the sample under study, with that from a near-perfect reflecting diffuser, dispersing the radiation either before or after reflection. This approach using one monochromator cannot provide a complete analysis of the radiometric properties of a fluorescent substance. The NPL Spectrofluorimeter described here has been developed to tackle this problem. The instrument uses two monochromators to enable the fluorescent radiation to be separated from the reflected radiation and to allow the spectral distribution of fluorescent emission to be studied, for a given excitation. Three types of spectrofluorimetric measurement are possible enabling the sample to be characterized in terms of a set of radiance factors, or in terms of its excitation and emission spectra, and permitting the behaviour of the sample under any stated illuminant to be predicted.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rona A. Burns, Rona A. Burns, F. J. J. Clarke, F. J. J. Clarke, J. F. Verrill, J. F. Verrill, "Measurement Of Fluorescent Radiation From Opaque Surfaces", Proc. SPIE 0234, New Developments and Applications in Optical Radiation Measurement, (18 November 1980); doi: 10.1117/12.958945; https://doi.org/10.1117/12.958945

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