Noncontacting Measurement Of Surface Roughness

W. T. Welford

doi:10.1117/12.958970

13 May 1981 Noncontacting Measurement Of Surface Roughness

W. T. Welford

Proceedings Volume 0235, Aspheric Optics: Design, Manufacture, Testing; (1981) https://doi.org/10.1117/12.958970
Event: Aspheric Optics: Design, Manufacture, Testing, 1980, London, United Kingdom

Abstract

For many purposes it is useful to describe a rough surface by some statistical parameters rather than deterministically; thus the variance of surface height and the correlation length may be useful statistical parameters which summarize the properties of surfaces produced by given methods. The use of scattered coherent light to obtain these parameters will be explained.

Citation Download Citation

W. T. Welford "Noncontacting Measurement Of Surface Roughness", Proc. SPIE 0235, Aspheric Optics: Design, Manufacture, Testing, (13 May 1981); https://doi.org/10.1117/12.958970

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available