15 May 1981 Absorption-Interferometric Technique For Mapping Temperature And Concentration Profiles During Crystal Growth From Solution
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Proceedings Volume 0236, 1980 European Conf on Optical Systems and Applications; (1981) https://doi.org/10.1117/12.958992
Event: 1980 European Conference on Optical Systems and Applications, 1980, Utrecht, Netherlands
Abstract
Two-dimensional mapping of a solution's temperature and concentration profiles is possible in principle by pointwise combination of data from simultaneous absorption and interferometric images. Preliminary feasibility analysis and experiments indicate that adequate precision is attainable for selected solution crystallization systems.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Paul J. Shlichta, Paul J. Shlichta, } "Absorption-Interferometric Technique For Mapping Temperature And Concentration Profiles During Crystal Growth From Solution", Proc. SPIE 0236, 1980 European Conf on Optical Systems and Applications, (15 May 1981); doi: 10.1117/12.958992; https://doi.org/10.1117/12.958992
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