Model-Based Scene Matching

D. Y. Tseng; D. K. Conti; W. O. Eckhardt; R. Nevatia; K. E. Olin; T. A. McCulloh

doi:10.1117/12.959150

23 December 1980 Model-Based Scene Matching

D. Y. Tseng, D. K. Conti, W. O. Eckhardt, R. Nevatia, K. E. Olin, T. A. McCulloh

Proceedings Volume 0238, Image Processing for Missile Guidance; (1980) https://doi.org/10.1117/12.959150
Event: 24th Annual Technical Symposium, 1980, San Diego, United States

Abstract

Advanced pattern matching techniques were developed that are capable of matching complex terrain scenes for use in midcourse navigational updating of aircraft and missiles. This method utilizes key features in an image to represent scene content. The key features are converted into a line-based model, which is then used in the actual matching process. The pattern-matching approach is more tolerant of scene diversities than are correlation techniques, and it can match scenes containing severe contrast reversal, small prominent features, or scale and orientation differences. Both high- and low-altitude flight profiles are considered, with matches performed for each case. Comparisons with conventional correlation are made for a variety of scenes.

Citation Download Citation

D. Y. Tseng, D. K. Conti, W. O. Eckhardt, R. Nevatia, K. E. Olin, and T. A. McCulloh "Model-Based Scene Matching", Proc. SPIE 0238, Image Processing for Missile Guidance, (23 December 1980); https://doi.org/10.1117/12.959150

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