23 December 1980 Radar And Optical Edge Measurements
Author Affiliations +
Proceedings Volume 0238, Image Processing for Missile Guidance; (1980); doi: 10.1117/12.959177
Event: 24th Annual Technical Symposium, 1980, San Diego, United States
Abstract
Several pattern recognition methods have been used in scene matching. These methods include the use of intensity difference, edge measurements, invariant moments and symbolic descriptions as measurement features. This paper describes a method used in extracting edge measurements from radar and optical images for the purpose of scene matching.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert Y. Wong, "Radar And Optical Edge Measurements", Proc. SPIE 0238, Image Processing for Missile Guidance, (23 December 1980); doi: 10.1117/12.959177; https://doi.org/10.1117/12.959177
PROCEEDINGS
3 PAGES


SHARE
KEYWORDS
Image processing

Radar

Optical testing

Computer engineering

Image registration

Missiles

Pattern recognition

RELATED CONTENT

Radar Image Registration And Rectification
Proceedings of SPIE (March 17 1983)
Optical Image Processing For Missile Guidance
Proceedings of SPIE (December 08 1977)
Visual navigation aid for planetary UAV risk reduction
Proceedings of SPIE (September 10 2007)
Image processing and fusion for landing guidance
Proceedings of SPIE (May 31 1996)

Back to Top