Performance Analysis Of Post Focal Plane Processing Using Charge Coupled Devices (CCDs)

David T. Lee; Jayvadan N. Patel

doi:10.1117/12.959324

18 February 1981 Performance Analysis Of Post Focal Plane Processing Using Charge Coupled Devices (CCDs)

David T. Lee, Jayvadan N. Patel

Proceedings Volume 0244, Mosaic Focal Plane Methodologies I; (1981) https://doi.org/10.1117/12.959324
Event: 24th Annual Technical Symposium, 1980, San Diego, United States

Abstract

In recent years, long wavelength infrared (LWIR) sensor systems have gained significant importance in a wide range of applications such as surveillance, reconnaissance and target acquisition. The interests in the LWIR sensor area can be reflected by the many technology development programs currently being sponsored and supported by NASA and the various DoD agencies.

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David T. Lee and Jayvadan N. Patel "Performance Analysis Of Post Focal Plane Processing Using Charge Coupled Devices (CCDs)", Proc. SPIE 0244, Mosaic Focal Plane Methodologies I, (18 February 1981); https://doi.org/10.1117/12.959324

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